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    ICCAD
    1995
    IEEE
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    Impulse response fault model and fault extraction for functional level analog circuit diagnosis

    13 years 9 months ago
    Impulse response fault model and fault extraction for functional level analog circuit diagnosis
    Download  www.iis.sinica.edu.tw
    Chauchin Su, Shenshung Chiang, Shyh-Jye Jou
    claim paper
    Added 26 Aug 2010
    Updated 26 Aug 2010
    Type Conference
    Year 1995
    Where ICCAD
    Authors Chauchin Su, Shenshung Chiang, Shyh-Jye Jou
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