Low Cost Built in Self Test for Public Key Crypto Cores

The testability of the cryptographic cores brings in an extra dimension to the process of digital circuits testing

• Type: Journal
• Year: 2010
• Where: FDTC
• Authors: Dusko Karaklajic, Miroslav Knezevic, Ingrid Verbauwhede
• Keywords: Cryptology, Digit-serial Multiplier, FDTC 2010, Low-end Embedded Devices, Test Pattern Generator