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MR
2011

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Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process

14 years 9 months ago

Design to suppress return-back leakage current of charge pump circuit in low-voltage CMOS process

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Yi-Hsin Weng, Hui-Wen Tsai, Ming-Dou Ker

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Added	14 May 2011
Updated	14 May 2011
Type	Journal
Year	2011
Where	MR
Authors	Yi-Hsin Weng, Hui-Wen Tsai, Ming-Dou Ker

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