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ISQED
2009
IEEE

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Simultaneous test pattern compaction, ordering and X-filling for testing power reduction

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Simultaneous test pattern compaction, ordering and X-filling for testing power reduction

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Ju-Yueh Lee, Yu Hu, Rupak Majumdar, Lei He

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Added	19 May 2010
Updated	19 May 2010
Type	Conference
Year	2009
Where	ISQED
Authors	Ju-Yueh Lee, Yu Hu, Rupak Majumdar, Lei He

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