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    ICCAD
    1995
    IEEE
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    Impulse response fault model and fault extraction for functional level analog circuit diagnosis

    13 years 10 months ago
    Impulse response fault model and fault extraction for functional level analog circuit diagnosis
    Download  www.iis.sinica.edu.tw
    Chauchin Su, Shenshung Chiang, Shyh-Jye Jou
    claim paper
    Added 26 Aug 2010
    Updated 26 Aug 2010
    Type Conference
    Year 1995
    Where ICCAD
    Authors Chauchin Su, Shenshung Chiang, Shyh-Jye Jou
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