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    A New Test Generation Approach for Embedded Analogue Cores in SoC

    15 years 1 months ago
    A New Test Generation Approach for Embedded Analogue Cores in SoC
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    M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T
    claim paper
    Added 15 Jul 2010
    Updated 15 Jul 2010
    Type Conference
    Year 2002
    Where ITC
    Authors M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff
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