100
Voted
ITC
15 years 4 months ago
1991 IEEE ITC
15 years 4 months ago
1991 IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
82
Voted
ITC
15 years 4 months ago
1991 IEEE
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
77
Voted
ITC
15 years 4 months ago
1991 IEEE 75
Voted
ITC
15 years 4 months ago
1991 IEEE |