225
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DFT
15 years 11 months ago
2004 IEEE 
A 3D Heterogeneous Sensor using a stacked chip is investigated. Optical Active Pixel Sensor and IR Bolometer detectors are combined to create a multispectral pixel for aligned col...
217
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DFT
15 years 11 months ago
2004 IEEE
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
206
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DFT
15 years 11 months ago
2004 IEEE 
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
193
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DFT
15 years 11 months ago
2004 IEEE 
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
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