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127
Voted
DFT
2004
IEEE
174views VLSI» more  DFT 2004»
15 years 4 months ago
Defect Avoidance in a 3-D Heterogeneous Sensor
A 3D Heterogeneous Sensor using a stacked chip is investigated. Optical Active Pixel Sensor and IR Bolometer detectors are combined to create a multispectral pixel for aligned col...
Glenn H. Chapman, Vijay K. Jain, Shekhar Bhansali
129
Voted
DFT
2004
IEEE
134views VLSI» more  DFT 2004»
15 years 4 months ago
On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
Jing Huang, Mehdi Baradaran Tahoori, Fabrizio Lomb...
109
Voted
DFT
2004
IEEE
118views VLSI» more  DFT 2004»
15 years 4 months ago
Defect Characterization for Scaling of QCA Devices
Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in...
Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tah...
110
Voted
DFT
2004
IEEE
114views VLSI» more  DFT 2004»
15 years 4 months ago
Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS)
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
Michelle L. La Haye, Glenn H. Chapman, Cory Jung, ...
108
Voted
DFT
2004
IEEE
102views VLSI» more  DFT 2004»
15 years 4 months ago
Exploiting an I-IP for In-Field SOC Test
Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza ...
VLSI
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