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DFT
2006
IEEE
105views VLSI» more  DFT 2006»
15 years 5 months ago
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
KDD
2004
ACM
213views Data Mining» more  KDD 2004»
15 years 5 months ago
Analytical view of business data
This paper describes a logical extension to Microsoft Business Framework (MBF) called Analytical View (AV). AV consists of three components: Model Service for design time, Busines...
Adam Yeh, Jonathan Tang, Youxuan Jin, Sam Skrivan
AAMAS
2005
Springer
14 years 11 months ago
Argumentation and the Dynamics of Warranted Beliefs in Changing Environments
One of the most difficult problems in Multi-Agent Systems (MAS) involves representing the knowledge and beliefs of an agent which performs its tasks in a dynamic environment. New p...
Marcela Capobianco, Carlos Iván Chesñ...
CUZA
2002
130views more  CUZA 2002»
14 years 11 months ago
Distributed Threads in Java
In this paper we present a mechanism for serializing the execution-state of a distributed Java application that is implemented on a conventional Object Request Broker (ORB) archite...
Danny Weyns, Eddy Truyen, Pierre Verbaeten
ICCAD
2006
IEEE
127views Hardware» more  ICCAD 2006»
15 years 8 months ago
Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky