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DFT
2006
IEEE
105views VLSI» more  DFT 2006»
15 years 3 months ago
Thermal-Aware SoC Test Scheduling with Test Set Partitioning and Interleaving
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
Zhiyuan He, Zebo Peng, Petru Eles, Paul M. Rosinge...
KDD
2004
ACM
213views Data Mining» more  KDD 2004»
15 years 3 months ago
Analytical view of business data
This paper describes a logical extension to Microsoft Business Framework (MBF) called Analytical View (AV). AV consists of three components: Model Service for design time, Busines...
Adam Yeh, Jonathan Tang, Youxuan Jin, Sam Skrivan
AAMAS
2005
Springer
14 years 9 months ago
Argumentation and the Dynamics of Warranted Beliefs in Changing Environments
One of the most difficult problems in Multi-Agent Systems (MAS) involves representing the knowledge and beliefs of an agent which performs its tasks in a dynamic environment. New p...
Marcela Capobianco, Carlos Iván Chesñ...
CUZA
2002
130views more  CUZA 2002»
14 years 9 months ago
Distributed Threads in Java
In this paper we present a mechanism for serializing the execution-state of a distributed Java application that is implemented on a conventional Object Request Broker (ORB) archite...
Danny Weyns, Eddy Truyen, Pierre Verbaeten
ICCAD
2006
IEEE
127views Hardware» more  ICCAD 2006»
15 years 6 months ago
Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky