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» A New Method for Interoperability Test Generation
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TCAD
2008
114views more  TCAD 2008»
14 years 11 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
SEMWEB
2005
Springer
15 years 5 months ago
Bootstrapping Ontology Alignment Methods with APFEL
Abstract. Ontology alignment is a prerequisite in order to allow for interoperation between different ontologies and many alignment strategies have been proposed to facilitate the ...
Marc Ehrig, Steffen Staab, York Sure
WISE
2003
Springer
15 years 5 months ago
Ontology Generation from Tables
At the heart of today’s information-explosion problems are issues involving semantics, mutual understanding, concept matching, and interoperability. Ontologies and the Semantic ...
Yuri A. Tijerino, David W. Embley, Deryle W. Lonsd...
ICCD
2002
IEEE
108views Hardware» more  ICCD 2002»
15 years 8 months ago
Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...
ET
2002
115views more  ET 2002»
14 years 11 months ago
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki