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105
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TCAD
2002
135views more  TCAD 2002»
14 years 11 months ago
Area fill synthesis for uniform layout density
Chemical-mechanical polishing (CMP) and other manufacturing steps in very deep submicron VLSI have varying effects on device and interconnect features, depending on local character...
Yu Chen, Andrew B. Kahng, Gabriel Robins, Alexande...
GIS
2005
ACM
16 years 21 days ago
ASPEN: an adaptive spatial peer-to-peer network
Geographic Information Systems (GIS) are increasingly managing very large sets of data and hence a centralized data repository may not always provide the most scalable solution. H...
Haojun Wang, Roger Zimmermann, Wei-Shinn Ku
103
Voted
SI3D
2005
ACM
15 years 5 months ago
Texture sprites: texture elements splatted on surfaces
We present a new interactive method to texture complex geometries at very high resolution, while using little memory and without the need for a global planar parameterization. We ...
Sylvain Lefebvre, Samuel Hornus, Fabrice Neyret
104
Voted
ICCD
2006
IEEE
97views Hardware» more  ICCD 2006»
15 years 8 months ago
Pesticide: Using SMT Processors to Improve Performance of Pointer Bug Detection
Pointer bugs associated with dynamically-allocated objects resulting in out-of-bounds memory access are an important class of software bugs. Because such bugs cannot be detected e...
Jin-Yi Wang, Yen-Shiang Shue, T. N. Vijaykumar, Sa...
VISUALIZATION
2005
IEEE
15 years 5 months ago
Topology-driven Surface Mappings with Robust Feature Alignment
Topological concepts and techniques have been broadly applied in computer graphics and geometric modeling. However, the homotopy type of a mapping between two surfaces has not bee...
Christopher Carner, Miao Jin, Xianfeng Gu, Hong Qi...