630 search results - page 29 / 126 » Causality based generation of directed test cases |
ET
2002
14 years 9 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
ICASSP
2009
IEEE
15 years 4 months ago
2009
IEEE
In this paper we propose a nonparametric hypothesis test for stationarity based on local Fourier analysis. We employ a test statistic that measures the variation of time-localized...
ICST
2010
IEEE
14 years 8 months ago
2010
IEEE
—Model-based testing is a well known technique that allows one to validate the correctness of software with respect to its model. If a lot of data is involved, symbolic technique...
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HASE
2002
IEEE
15 years 2 months ago
2002
IEEE
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...
KBSE
2005
IEEE
15 years 3 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...