170 search results - page 8 / 34 » Challenges in Embedded Memory Design and Test |
124
Voted
DAC
2000
ACM
16 years 4 months ago
2000
ACM
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
136
Voted
ICST
2008
IEEE
15 years 10 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
133
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GLVLSI
2010
IEEE
15 years 8 months ago
2010
IEEE
Flash Memory is a desirable candidate for main memory replacement in embedded systems due to its low leakage power consumption, higher density and non-volatility characteristics. ...
132
Voted
HIPEAC
2005
Springer
15 years 9 months ago
2005
Springer
Abstract. Power efficiency has become a key design trade-off in embedded system designs. For system-on-a-chip embedded systems, an external bus interconnects embedded processor co...
132
Voted
GLVLSI
2008
IEEE
15 years 10 months ago
2008
IEEE
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...