170 search results - page 8 / 34 » Challenges in Embedded Memory Design and Test |
DAC
2000
ACM
16 years 21 days ago
2000
ACM
At-speed testing of GHz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost, high-quality self-test m...
ICST
2008
IEEE
15 years 6 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
GLVLSI
2010
IEEE
15 years 4 months ago
2010
IEEE
Flash Memory is a desirable candidate for main memory replacement in embedded systems due to its low leakage power consumption, higher density and non-volatility characteristics. ...
HIPEAC
2005
Springer
15 years 5 months ago
2005
Springer
Abstract. Power efficiency has become a key design trade-off in embedded system designs. For system-on-a-chip embedded systems, an external bus interconnects embedded processor co...
GLVLSI
2008
IEEE
15 years 6 months ago
2008
IEEE
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...