3002 search results - page 225 / 601 » Cloud Based Design Optimization |
191
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VTS
2006
IEEE
15 years 11 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
135
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DSD
2005
IEEE
15 years 11 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
146
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ISCAS
2005
IEEE
15 years 11 months ago
2005
IEEE
—JPEG2000 image compression standard is designed to cater the needs of a large span of applications including numerous consumer products. However, its use is still restricted due...
130
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ISCC
2005
IEEE
15 years 11 months ago
2005
IEEE
This study deals with the Delay-Constrained Minimum Cost Loop Problem (DC-MCLP) of finding several loops from a source node. The DC-MCLP consists of finding a set of minimum cost ...
251
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ACPC
1999
Springer
15 years 9 months ago
1999
Springer
In this paper we present the design, implementation and evaluation of a runtime system based on collective I/O techniques for irregular applications. Its main goal is to provide pa...