565 search results - page 33 / 113 » Compositional dynamic test generation |
111
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ICCD
2006
IEEE
15 years 11 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
137
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GECCO
2005
Springer
15 years 7 months ago
2005
Springer
As the paradigm of object orientation becomes more and more important for modern IT development projects, the demand for an automated test case generation to dynamically test obje...
128
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ET
2002
15 years 1 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
103
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TACAS
2009
Springer
15 years 8 months ago
2009
Springer
We describe the design and implementation of an automatic invariant generator for imperative programs. While automatic invariant generation through constraint solving has been exte...
116
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ENTCS
2010
15 years 2 months ago
2010
Component based development allows to build software upon existing components and promises to improve software reuse and reduce costs. To gain reliability of a component based sys...