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search results - page 110 / 860
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Concurrent Test Generation
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TAP
2010
Springer
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Generating Regression Unit Tests Using a Combination of Verification and Capture & Replay
15 years 8 months ago
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www.uni-koblenz.de
Christoph Gladisch, Shmuel S. Tyszberowicz, Bernha...
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DATE
2002
IEEE
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DATE 2002
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Internet-Based Collaborative Test Generation with MOSCITO
15 years 8 months ago
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www.pld.ttu.ee
André Schneider, Karl-Heinz Diener, Eero Iv...
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109
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DFT
2002
IEEE
108
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A Test-Vector Generation Methodology for Crosstalk Noise Faults
15 years 8 months ago
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www.ece.neu.edu
Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park
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ITC
2002
IEEE
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ITC 2002
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A New Test Generation Approach for Embedded Analogue Cores in SoC
15 years 8 months ago
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doc.utwente.nl
M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T...
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GECCO
2009
Springer
209
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Optimization
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GECCO 2009
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MC/DC automatic test input data generation
15 years 8 months ago
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squirrel.polymtl.ca
Zeina Awedikian, Kamel Ayari, Giuliano Antoniol
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