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87
Voted
TAP
2010
Springer
92views Hardware» more  TAP 2010»
15 years 8 months ago
Generating Regression Unit Tests Using a Combination of Verification and Capture & Replay
Christoph Gladisch, Shmuel S. Tyszberowicz, Bernha...
DATE
2002
IEEE
88views Hardware» more  DATE 2002»
15 years 8 months ago
Internet-Based Collaborative Test Generation with MOSCITO
André Schneider, Karl-Heinz Diener, Eero Iv...
109
Voted
DFT
2002
IEEE
108views VLSI» more  DFT 2002»
15 years 8 months ago
A Test-Vector Generation Methodology for Crosstalk Noise Faults
Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park
ITC
2002
IEEE
127views Hardware» more  ITC 2002»
15 years 8 months ago
A New Test Generation Approach for Embedded Analogue Cores in SoC
M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T...
GECCO
2009
Springer
209views Optimization» more  GECCO 2009»
15 years 8 months ago
MC/DC automatic test input data generation
Zeina Awedikian, Kamel Ayari, Giuliano Antoniol