4299 search results - page 161 / 860 » Concurrent Test Generation |
125
Voted
ASPDAC
2007
ACM
15 years 7 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
160
Voted
GECCO
2005
Springer
15 years 9 months ago
2005
Springer
As the paradigm of object orientation becomes more and more important for modern IT development projects, the demand for an automated test case generation to dynamically test obje...
158
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ICST
2009
IEEE
15 years 10 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
144
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ET
2002
15 years 3 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
108
Voted
FATES
2003
Springer
15 years 8 months ago
2003
Springer
We present work on a tool environment for model-based testing with the Abstract State Machine Language (AsmL). Our environment supports semiautomatic parameter generation, call seq...