Sciweavers

4299 search results - page 209 / 860
» Concurrent Test Generation
Sort
View
DAC
1996
ACM
15 years 8 months ago
Characterization and Parameterized Random Generation of Digital Circuits
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
Michael D. Hutton, Jerry P. Grossman, Jonathan Ros...
TEC
2011
77views more  TEC 2011»
14 years 10 months ago
Differential Evolution With Composite Trial Vector Generation Strategies and Control Parameters
—Trial vector generation strategies and control parameters have a significant influence on the performance of differential evolution (DE). This paper studies whether the performa...
Yong Wang, Zixing Cai, Qingfu Zhang
PVLDB
2010
97views more  PVLDB 2010»
15 years 2 months ago
Generating Databases for Query Workloads
To evaluate the performance of database applications and DBMSs, we usually execute workloads of queries on generated databases of different sizes and measure the response time. Th...
Eric Lo, Nick Cheng, Wing-Kai Hon
ISAAC
2007
Springer
131views Algorithms» more  ISAAC 2007»
15 years 10 months ago
On the Fault Testing for Reversible Circuits
This paper shows that it is NP-hard to generate a minimum complete test set for stuck-at faults on the wires of a reversible circuit. We also show non-trivial lower bounds for the ...
Satoshi Tayu, Shigeru Ito, Shuichi Ueno
PLDI
2005
ACM
15 years 9 months ago
DART: directed automated random testing
We present a new tool, named DART, for automatically testing software that combines three main techniques: (1) automated extraction of the interface of a program with its external...
Patrice Godefroid, Nils Klarlund, Koushik Sen