15 search results - page 1 / 3 » Configuring multiple scan chains for minimum test time |
58
Voted
ICCAD
1992
IEEE
15 years 2 months ago
1992
IEEE
90
Voted
VTS
2003
IEEE
15 years 3 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
ITC
2003
IEEE
15 years 3 months ago
2003
IEEE
81
Voted
ICCAD
2007
IEEE
15 years 7 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
69
Voted
DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...