27 search results - page 1 / 6 » DRAM reliability |
DAC
2009
ACM
15 years 11 months ago
2009
ACM
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
102
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CODES
2011
IEEE
13 years 10 months ago
2011
IEEE
Designing memory controllers for complex real-time and highperformance multi-processor systems-on-chip is challenging, since sufficient capacity and (real-time) performance must b...
106
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ISCA
2012
IEEE
13 years 19 days ago
2012
IEEE
Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
ASPLOS
2010
ACM
15 years 5 months ago
2010
ACM
DRAM is facing severe scalability challenges in sub-45nm technology nodes due to precise charge placement and sensing hurdles in deep-submicron geometries. Resistive memories, suc...
