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ET
2002
97views more  ET 2002»
14 years 11 months ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
ICCD
2000
IEEE
123views Hardware» more  ICCD 2000»
15 years 8 months ago
Analysis and Optimization of Ground Bounce in Digital CMOS Circuits
This paper is concerned with the analysis and optimization of the ground bounce in digital CMOS circuits. First, an analytical method for calculating of the ground bounce is presen...
Payam Heydari, Massoud Pedram
ASPDAC
2006
ACM
137views Hardware» more  ASPDAC 2006»
15 years 5 months ago
Parameterized block-based non-gaussian statistical gate timing analysis
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...
Soroush Abbaspour, Hanif Fatemi, Massoud Pedram
ASPDAC
2006
ACM
102views Hardware» more  ASPDAC 2006»
15 years 5 months ago
An O(mn) time algorithm for optimal buffer insertion of nets with m sinks
— Buffer insertion is an effective technique to reduce interconnect delay. In this paper, we give a simple O(mn) time algorithm for optimal buffer insertion, where m is the numbe...
Zhuo Li, Weiping Shi
IPPS
2010
IEEE
14 years 9 months ago
Reconciling scratch space consumption, exposure, and volatility to achieve timely staging of job input data
Innovative scientific applications and emerging dense data sources are creating a data deluge for highend computing systems. Processing such large input data typically involves cop...
Henry M. Monti, Ali Raza Butt, Sudharshan S. Vazhk...