3514 search results - page 677 / 703 » Evolving Specification Engineering |
148
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IOLTS
2007
IEEE
15 years 11 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
155
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LADC
2007
Springer
15 years 11 months ago
2007
Springer
Analysis and design patterns are well established as a convenient and reusable way to build high-quality object-oriented software. Patterns combine experience and good practices t...
166
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CCGRID
2006
IEEE
15 years 11 months ago
2006
IEEE
Component-based software construction is widely used in a variety of applications, from embedded environments to grid computing. However, errors in these applications and systems ...
154
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CODES
2006
IEEE
15 years 11 months ago
2006
IEEE
Designer productivity and design predictability are vital factors for successful embedded system design. Shrinking time-to-market and increasing complexity of these systems requir...
156
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CODES
2006
IEEE
15 years 11 months ago
2006
IEEE
System-on-chip communication architectures have a significant impact on the performance and power consumption of modern multiprocessor system-on-chips (MPSoCs). However, customiza...