568 search results - page 31 / 114 » FAST - An Automatic Generation System for Grammar Tests |
195
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PLDI
2009
ACM
15 years 10 months ago
2009
ACM
High-level languages are growing in popularity. However, decades of C software development have produced large libraries of fast, timetested, meritorious code that are impractical...
RSP
2003
IEEE
15 years 3 months ago
2003
IEEE
Model-based testing relies on the use of behavior models to automatically generate sequences of inputs and expected outputs. These sequences can be used as test cases to the end o...
106
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TASE
2011
IEEE
14 years 1 months ago
2011
IEEE
Abstract—A fast offset surface generation approach is presented in this paper to construct intersection-free offset surfaces, which preserve sharp features, from freeform triangu...
ET
2002
14 years 9 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
102
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CASES
2006
ACM
15 years 3 months ago
2006
ACM
Developing an optimizing compiler for a newly proposed architecture is extremely difficult when there is only a simulator of the machine available. Designing such a compiler requ...