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DATE
2008
IEEE
104views Hardware» more  DATE 2008»
15 years 4 months ago
Multi-Vector Tests: A Path to Perfect Error-Rate Testing
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
Shideh Shahidi, Sandeep Gupta
IOLTS
2008
IEEE
117views Hardware» more  IOLTS 2008»
15 years 4 months ago
Verification and Analysis of Self-Checking Properties through ATPG
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
Marc Hunger, Sybille Hellebrand
PVLDB
2011
14 years 18 days ago
CoHadoop: Flexible Data Placement and Its Exploitation in Hadoop
Hadoop has become an attractive platform for large-scale data analytics. In this paper, we identify a major performance bottleneck of Hadoop: its lack of ability to colocate relat...
Mohamed Y. Eltabakh, Yuanyuan Tian, Fatma Özc...
INFOCOM
2007
IEEE
15 years 4 months ago
Data Persistence in Large-Scale Sensor Networks with Decentralized Fountain Codes
Abstract—It may not be feasible for sensor networks monitoring nature and inaccessible geographical regions to include powered sinks with Internet connections. We consider the sc...
Yunfeng Lin, Ben Liang, Baochun Li
JSA
2000
100views more  JSA 2000»
14 years 9 months ago
Stripped mirroring RAID architecture
Redundant arrays of independent disks (RAID) provide an ecient stable storage system for parallel access and fault tolerance. The most common fault tolerant RAID architecture is R...
Hai Jin, Kai Hwang