This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
Functional, instruction-based self-testing of microprocessors has recently emerged as an effective alternative or supplement to other testing approaches, and is progressively adop...
Andreas Apostolakis, Dimitris Gizopoulos, Mihalis ...
We consider self-testing of complete wireless nodes in the field through a low-energy software-based selftest (SBST) method. Energy consumption is optimized both for individual co...
A new method for test resource partitioning is introduced which keeps the design-for-test logic independent of the test set and moves the test pattern dependent information to an ...
Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Valent...