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» Minimizing the Impact of Scan Compression
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120
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DFT
2006
IEEE
203views VLSI» more  DFT 2006»
15 years 5 months ago
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
Ondrej Novák, Zdenek Plíva, Jiri Jen...
ICIP
2010
IEEE
14 years 9 months ago
Sectional image reconstruction in optical scanning holography using compressed sensing
Optical scanning holography is a form of digital holographic system, which allows us to capture a three-dimensional (3D) object in the two-dimensional (2D) hologram. A postprocess...
Xin Zhang, Edmund Y. Lam
130
Voted
VTS
2006
IEEE
133views Hardware» more  VTS 2006»
15 years 5 months ago
PEAKASO: Peak-Temperature Aware Scan-Vector Optimization
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
Minsik Cho, David Z. Pan
82
Voted
ITC
2003
IEEE
149views Hardware» more  ITC 2003»
15 years 5 months ago
On Reducing Aliasing Effects and Improving Diagnosis of Logic BIST Failures
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
Ramesh C. Tekumalla
ICASSP
2010
IEEE
14 years 12 months ago
Compressive detection for wide-band spectrum sensing
In this paper we propose a novel wide-band spectrum sensing scheme using compressive sensing. The wide-band signal is fed into a number of wide-band filters and the outputs of th...
Veria Havary-Nassab, Sadiq Hassan, Shahrokh Valaee