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» Minimizing the Impact of Scan Compression
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DFT
2006
IEEE
203views VLSI» more  DFT 2006»
15 years 3 months ago
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
Ondrej Novák, Zdenek Plíva, Jiri Jen...
ICIP
2010
IEEE
14 years 7 months ago
Sectional image reconstruction in optical scanning holography using compressed sensing
Optical scanning holography is a form of digital holographic system, which allows us to capture a three-dimensional (3D) object in the two-dimensional (2D) hologram. A postprocess...
Xin Zhang, Edmund Y. Lam
VTS
2006
IEEE
133views Hardware» more  VTS 2006»
15 years 3 months ago
PEAKASO: Peak-Temperature Aware Scan-Vector Optimization
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
Minsik Cho, David Z. Pan
ITC
2003
IEEE
149views Hardware» more  ITC 2003»
15 years 2 months ago
On Reducing Aliasing Effects and Improving Diagnosis of Logic BIST Failures
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
Ramesh C. Tekumalla
ICASSP
2010
IEEE
14 years 9 months ago
Compressive detection for wide-band spectrum sensing
In this paper we propose a novel wide-band spectrum sensing scheme using compressive sensing. The wide-band signal is fed into a number of wide-band filters and the outputs of th...
Veria Havary-Nassab, Sadiq Hassan, Shahrokh Valaee