571 search results - page 53 / 115 » New Event-Processing Design Patterns Using CEP |
111
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ETS
2007
IEEE
15 years 10 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
204
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ICSE
2012
IEEE-ACM
13 years 6 months ago
2012
IEEE-ACM
—At ICSE 2010, the Code Bubbles team from Brown University and the Code Canvas team from Microsoft Research presented similar ideas for new user experiences for an integrated dev...
140
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ICWE
2005
Springer
15 years 10 months ago
2005
Springer
We present the design of a new web application framework for collaborative learning. The framework guides users (i.e. teachers) in implementing online activities based on well-know...
146
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MICRO
2006
IEEE
15 years 10 months ago
2006
IEEE
Power delivery is a growing reliability concern in microprocessors as the industry moves toward feature-rich, powerhungrier designs. To battle the ever-aggravating power consumpti...
140
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ECAL
2003
Springer
15 years 9 months ago
2003
Springer
Fractal proteins are a new evolvable method of mapping genotype to phenotype through a developmental process, where genes are expressed into proteins comprised of subsets of the Ma...