1241 search results - page 67 / 249 » Path-oriented random testing |
115
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PLDI
2012
ACM
13 years 4 months ago
2012
ACM
To report a compiler bug, one must often find a small test case that triggers the bug. The existing approach to automated test-case reduction, delta debugging, works by removing ...
173
Voted
ICCV
2009
IEEE
16 years 7 months ago
2009
IEEE
Partially occluded faces are common in many applications
of face recognition. While algorithms based on sparse
representation have demonstrated promising results, they
achieve t...
203
Voted
ICCV
2007
IEEE
16 years 4 months ago
2007
IEEE
We explore the problem of classifying images by the object categories they contain in the case of a large number of object categories. To this end we combine three ingredients: (i...
121
Voted
ICPR
2002
IEEE
16 years 3 months ago
2002
IEEE
Markov Random Fields (MRFs) are proposed as viable stochastic models for the spatial distribution of gray level intensities for images of human faces. These models are trained usi...
123
Voted
DAC
2003
ACM
16 years 3 months ago
2003
ACM
This paper presents a power grid analyzer based on a random walk technique. A linear-time algorithm is first demonstrated for DC analysis, and is then extended to perform transien...