68 search results - page 9 / 14 » Test Suite Reduction in Conformance Testing |
89
Voted
DATE
2003
IEEE
15 years 2 months ago
2003
IEEE
Reduction of both the test suite size and the download time of test vectors is important in today's System-On-a-Chip designs. In this paper, a method for compressing the scan...
VTS
1997
IEEE
15 years 1 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
100
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CORR
2010
Springer
2010
Springer
Reliable Mining of Automatically Generated Test Cases from Software Requirements Specification (SRS)
14 years 9 months ago
Writing requirements is a two-way process. In this paper we use to classify Functional Requirements (FR) and Non Functional Requirements (NFR) statements from Software Requirement...
DAC
2009
ACM
15 years 10 months ago
2009
ACM
Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural speci...
108
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AICT
2008
IEEE
14 years 9 months ago
2008
IEEE
This paper presents the simplified method of random test suite based on the frequency (block) test. The test is used to check the first property of random numbers which is to have ...