22 search results - page 2 / 5 » Test Volume and Application Time Reduction Through Scan Chai... |
VTS
2002
IEEE
13 years 11 months ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
ICCAD
2007
IEEE
14 years 3 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
VLSID
2005
IEEE
14 years 6 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
ITC
2003
IEEE
13 years 11 months ago
2003
IEEE
ISQED
2010
IEEE
13 years 11 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...