Sciweavers

5855 search results - page 106 / 1171
» Test generation and minimization with
Sort
View
ITC
2002
IEEE
127views Hardware» more  ITC 2002»
15 years 6 months ago
A New Test Generation Approach for Embedded Analogue Cores in SoC
M. Stancic, L. Fang, M. H. H. Weusthof, R. M. W. T...
GECCO
2009
Springer
209views Optimization» more  GECCO 2009»
15 years 6 months ago
MC/DC automatic test input data generation
Zeina Awedikian, Kamel Ayari, Giuliano Antoniol
ICSE
2009
IEEE-ACM
15 years 6 months ago
Automated Test Program Generation for an Industrial Optimizing Compiler
Chen Zhao, Yunzhi Xue, Qiuming Tao, Liang Guo, Zha...