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FMCAD
2006
Springer
15 years 5 months ago
Automatic Generation of Schedulings for Improving the Test Coverage of Systems-on-a-Chip
Claude Helmstetter, Florence Maraninchi, Laurent M...
ATS
1995
IEEE
91views Hardware» more  ATS 1995»
15 years 5 months ago
Deterministic test generation for non-classical faults on the gate level
Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck