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SAC
1997
ACM
15 years 5 months ago
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
97
Voted
ICTAI
1994
IEEE
15 years 5 months ago
GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
ITC
1994
IEEE
136views Hardware» more  ITC 1994»
15 years 5 months ago
An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
107
Voted
ET
2008
93views more  ET 2008»
15 years 1 months ago
Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique
Swarup Bhunia, Hamid Mahmoodi, Arijit Raychowdhury...