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116
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VTS
2008
IEEE
15 years 8 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
136
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ITICSE
2005
ACM
15 years 7 months ago
2005
ACM
The complexity of languages like Java and C++ can make introductory programming classes in these languages extremely challenging for many students. Part of the complexity comes fr...
107
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ENTCS
2007
15 years 1 months ago
2007
Several model-checker based methods to automated test-case generation have been proposed recently. The performance and applicability largely depends on the complexity of the model...
128
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ET
2002
15 years 1 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
102
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ORL
2002
15 years 1 months ago
2002
Dial-a-Ride systems involve dispatching a vehicle to satisfy demands from a set of customers who call a vehicle operating agency requesting that an item be picked up from a specif...