4305 search results - page 64 / 861 » The Test of Time |
153
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GECCO
2007
Springer
15 years 12 months ago
2007
Springer
Algorithms for the construction of software interaction test suites have focussed on the special case of pairwise coverage; less is known about efficiently constructing test suite...
172
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ITC
1996
IEEE
15 years 10 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
145
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COCO
2006
Springer
15 years 7 months ago
2006
Springer
We study the identity testing problem for depth 3 arithmetic circuits ( circuit). We give the first deterministic polynomial time identity test for circuits with bounded top fanin...
148
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DELTA
2004
IEEE
15 years 9 months ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
146
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ICALP
2010
Springer
15 years 9 months ago
2010
Springer
We present an O(m + n)-time algorithm that tests if a given directed graph is 2-vertex connected, where m is the number of arcs and n is the number of vertices. Based on this resul...