34 search results - page 4 / 7 » Tolerating Hard Faults in Microprocessor Array Structures |
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
132
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TC
2011
14 years 4 months ago
2011
—Aggressive technology scaling to 45nm and below introduces serious reliability challenges to the design of microprocessors. Since a large fraction of chip area is devoted to on-...
88
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MICRO
2009
IEEE
15 years 4 months ago
2009
IEEE
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
EMSOFT
2005
Springer
15 years 3 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
ISLPED
2004
ACM
15 years 2 months ago
2004
ACM
Microprocessor designers use techniques such as clock gating to reduce power dissipation. An unfortunate side-effect of these techniques is the processor current fluctuations th...