1951 search results - page 39 / 391 » UML-Based integration testing |
143
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ESCIENCE
2007
IEEE
15 years 11 months ago
2007
IEEE
With the proliferation of Grid computing, a large number of computational resources are available for solving complex scientific and engineering problems. Nevertheless, it is non-...
123
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VTS
2006
IEEE
15 years 11 months ago
2006
IEEE
This paper presents the design and experimental results of fully integrated CMOS power sensors for RF built-in self-test (BIST) applications. Using a standard 0.18- m CMOS process...
171
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EVOW
2001
Springer
15 years 10 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
137
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DATE
1997
IEEE
15 years 9 months ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
172
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COMPSAC
2001
IEEE
15 years 9 months ago
2001
IEEE
Regression testing has been a popular quality assurance technique. Most regression testing techniques are based on code or software design. This paper proposes a scenario-based fu...