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ICRA
2006
IEEE
81views Robotics» more  ICRA 2006»
15 years 3 months ago
Hardware-in-the-loop Test Rig for Designing Near-earth Aerial Robotics
Today’s aerial robots are being tasked to fly in nearEarth environments such as caves, forests and buildings. The lack of flight data and performance metrics poses a gap that ...
Vefa Narli, Paul Y. Oh
GPCE
2003
Springer
15 years 2 months ago
A Case for Test-Code Generation in Model-Driven Systems
A primary goal of generative programming and model-driven ent is to raise the level of abstraction at which designers and developers interact with the software systems they are bui...
Matthew J. Rutherford, Alexander L. Wolf
TCAD
2010
102views more  TCAD 2010»
14 years 4 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DFT
2006
IEEE
125views VLSI» more  DFT 2006»
15 years 3 months ago
Synthesis of Efficient Linear Test Pattern Generators
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
Avijit Dutta, Nur A. Touba
ET
2002
84views more  ET 2002»
14 years 9 months ago
Hardware Generation of Random Single Input Change Test Sequences
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
René David, Patrick Girard, Christian Landr...