Sciweavers

872 search results - page 34 / 175
» UML-based design test generation
Sort
View
109
Voted
ASPDAC
2007
ACM
108views Hardware» more  ASPDAC 2007»
15 years 5 months ago
Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz
132
Voted
ATS
2000
IEEE
149views Hardware» more  ATS 2000»
15 years 6 months ago
Charge sharing fault analysis and testing for CMOS domino logic circuits
Because domino logic design offers smaller area and faster delay than conventional CMOS design, it is very popular in the high-performance processor design. However, domino logic ...
Ching-Hwa Cheng, Wen-Ben Jone, Jinn-Shyan Wang, Sh...
138
Voted
ICST
2009
IEEE
15 years 8 months ago
Using JML Runtime Assertion Checking to Automate Metamorphic Testing in Applications without Test Oracles
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
Christian Murphy, Kuang Shen, Gail E. Kaiser
ET
2002
115views more  ET 2002»
15 years 1 months ago
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
CSREASAM
2006
15 years 3 months ago
Firewall Design: Understandable, Designable and Testable
Firewalls are the cornerstones of network security. To make firewalls working effectively, firewall manager must design firewall rules and the rule order correctly. In this paper, ...
Yan-ning Huang, Yong Jiang