530 search results - page 18 / 106 » Universal randomized switching |
104
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CEC
2005
IEEE
15 years 7 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
136
Voted
CAV
2006
Springer
15 years 5 months ago
2006
Springer
We propose and evaluate a new algorithm for checking the universality of nondeterministic finite automata. In contrast to the standard algorithm, which uses the subset construction...
158
Voted
ISCA
2012
IEEE
13 years 4 months ago
2012
IEEE
—As the scales of parallel applications and platforms increase the negative impact of communication latencies on performance becomes large. Fortunately, modern High Performance C...
109
Voted
SASO
2008
IEEE
15 years 8 months ago
2008
IEEE
Many real–world networks show a scale–free degree distribution, a structure that is known to be very stable in case of random failures. Unfortunately, the very same structure ...
TREC
2004
15 years 3 months ago
2004
Our system for the Novelty Track at TREC 2004 looks beyond sentence boundaries as well as within sentences to identify novel, nonduplicative passages. It tries to identify text sp...