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MR
2007
127views Robotics» more  MR 2007»
14 years 11 months ago
A comprehensive model for PMOS NBTI degradation: Recent progress
Muhammad Ashraful Alam, Haldun Kufluoglu, D. Vargh...
MR
2007
102views Robotics» more  MR 2007»
14 years 11 months ago
Electrical measurements of voltage stressed Al2O3/GaAs MOSFET
Z. Tang, P. D. Ye, D. Lee, C. R. Wie
MR
2006
71views Robotics» more  MR 2006»
14 years 11 months ago
High-temperature reliability of Flip Chip assemblies
T. Braun, K.-F. Becker, M. Koch, V. Bader, Rolf As...
MR
2002
75views Robotics» more  MR 2002»
14 years 11 months ago
DRAM reliability
Kinam Kim, Gi-Tae Jeong, Chan-Woong Chun, Sam-Jin ...