DSD
2010
IEEE
13 years 2 months ago
2010
IEEE
Abstract--Recent technology trends have made radiationinduced soft errors a growing threat to the reliability of microprocessors, a problem previously only known to the aerospace i...
CSREAESA
2006
13 years 6 months ago
2006
- Triple Modular Redundancy is widely used in dependable systems design to ensure high reliability against soft errors. Conventional TMR is effective in protecting sequential circu...
DSN
2005
IEEE
13 years 6 months ago
2005
IEEE
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture-level studies of soft errors since the architecture can mask many raw errors an...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
ASPDAC
2008
ACM
13 years 6 months ago
2008
ACM
- As deep submicron technologies are advanced, we face new challenges, such as power consumption and soft errors. A na
USENIX
2007
13 years 7 months ago
2007
Memory state can be corrupted by the impact of particles causing single-event upsets (SEUs). Understanding and dealing with these soft (or transient) errors is important for syste...
ASPDAC
2006
ACM
13 years 8 months ago
2006
ACM
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
— The use of dynamic voltage and frequency scaling (DVFS) in contemporary multicores provides significant protection from unpredictable thermal events. A side effect of DVFS can ...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper, a new paradigm for designing logic circuits with concurrent error detection (CED) is described. The key idea is to exploit the asymmetric soft error susceptibility ...