19 search results - page 1 / 4 » New static compaction techniques of test sequences for seque... |
DATE
1997
IEEE
13 years 9 months ago
1997
IEEE
ATS
1998
IEEE
13 years 9 months ago
1998
IEEE
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
VTS
1997
IEEE
13 years 9 months ago
1997
IEEE
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
EURODAC
1995
IEEE
13 years 8 months ago
1995
IEEE
: We present a new, dynamic algorithm for test sequence compaction and test cycle reduction for combinationaland sequential circuits. Several dynamic algorithms for compaction in c...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...