5 search results - page 1 / 1 » Oscillation ring based interconnect test scheme for SOC |
ASPDAC
2005
ACM
13 years 6 months ago
2005
ACM
－ We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
– We propose an interconnect diagnosis scheme based on Oscillation Ring test methodology for SOC design with heterogeneous cores. The target fault models are delay faults and cro...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
SLIP
2005
ACM
13 years 10 months ago
2005
ACM
We propose in this paper a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two ...
GLVLSI
2006
IEEE
13 years 10 months ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...