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ITC
2003
IEEE
167views Hardware» more  ITC 2003»
13 years 10 months ago
Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk
A technique to derive test vectors that exercise the worstcase delay effects in a domino circuit in the presence of crosstalk is described. A model for characterizing the delay of...
Rahul Kundu, R. D. (Shawn) Blanton
ICCAD
2003
IEEE
135views Hardware» more  ICCAD 2003»
13 years 10 months ago
ATPG for Noise-Induced Switch Failures in Domino Logic
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
Rahul Kundu, R. D. (Shawn) Blanton
ATS
2000
IEEE
149views Hardware» more  ATS 2000»
13 years 9 months ago
Charge sharing fault analysis and testing for CMOS domino logic circuits
Because domino logic design offers smaller area and faster delay than conventional CMOS design, it is very popular in the high-performance processor design. However, domino logic ...
Ching-Hwa Cheng, Wen-Ben Jone, Jinn-Shyan Wang, Sh...
PATMOS
2004
Springer
13 years 10 months ago
Delay Evaluation of High Speed Data-Path Circuits Based on Threshold Logic
The main result is the development, and delay comparison based on Logical Effort, of a number of high speed circuits for common arithmetic and related operations using threshold l...
Peter Celinski, Derek Abbott, Sorin Cotofana
ATS
2003
IEEE
75views Hardware» more  ATS 2003»
13 years 10 months ago
An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer