— In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nan...
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...
This paper approaches statistical optimization by examining gate delay variation models and optimization objectives. Most previous work on statistical optimization has focused exc...
Matthew R. Guthaus, Natesan Venkateswaran, Vladimi...
Gate sizing and threshold voltage (Vt) assignment are popular techniques for circuit timing and power optimization. Existing methods, by and large, are either sensitivity-driven h...
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interi...