21 search results - page 1 / 5 » A Test-Vector Generation Methodology for Crosstalk Noise Fau... |
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
DAC
2000
ACM
14 years 5 months ago
2000
ACM
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
ISVLSI
2007
IEEE
13 years 11 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
ET
2002
13 years 4 months ago
2002
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...