28 search results - page 2 / 6 » A Unified Approach for SOC Testing Using Test Data Compressi... |
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the ai...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...