65 search results - page 1 / 13 » An on Chip ADC Test Structure |
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, a new built-in self-test structure to test the static specifications of analog to digital converters (ADCs) is presented. A ramp signal generated by an integrator ...
ISCAS
2005
IEEE
13 years 10 months ago
2005
IEEE
— This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with deterministic dynamic element matching (DDEM). In this work, the...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we present a BIST scheme for testing onchip AD and DA converters. We discuss on-chip generation of linear ramps as test stimuli, and propose techniques for measurin...
ITC
1993
IEEE
13 years 8 months ago
1993
IEEE
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
ADC
2007
Springer
13 years 11 months ago
2007
Springer
A huge diversity of biological databases is available via the Internet, but many of these databases have been developed in an ad hoc manner rather than in accordance with any data...