135 search results - page 2 / 27 » Design challenges at 65nm and beyond |
ISQED
2010
IEEE
13 years 3 months ago
2010
IEEE
Reduced device dimensions and operating voltages that accompany technology scaling have led to increased design challenges with each successive technology node. Large scale 6T SRA...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
The use of CMOS nanometer technologies at 65 nm and below will pose serious challenges on the design of mixed-signal integrated systems in the very near future. Rising design comp...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
The prospective use of upcoming nanometer CMOS technology nodes (65nm, 45nm, and beyond) in bioelectronic interfaces is raising a number of important issues concerning circuit arc...
TCAD
2008
13 years 5 months ago
2008
As CMOS technology is scaled down toward the nanoscale regime, drastically growing leakage currents and variations in device characteristics are becoming two important design chall...
DATE
2009
IEEE
14 years 2 days ago
2009
IEEE
— Clock-gating and power-gating have proven to be very effective solutions for reducing dynamic and static power, respectively. The two techniques may be coupled in such a way th...